Meetings のバックアップ(No.6) - X線トポグラフィ研究会ホームページ

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関連する国際会議 †

Denver X-ray Conference, 1-5 August 2011, Colorado Springs, Colorado, USA
http://www.dxcicdd.com/11/index.htm
Deadline for submission of abstracts is 15 Feb. 2011.

DRIP XIV, 14th International Conference on Defects - Recognition, imaging and　Physics in Semiconductors, September 25-29，2011, MIYAZAKI, JAPAN
http://www.miyazaki-u.ac.jp/~drip14/index.html
Abstract Submission Deadline: April 25, 2011

XTOP 1010, 20th-23rd September 2010, University of Warwick (UK)
10th Biennial Conference on High Resolution X-Ray Diffraction and Imaging
http://www2.warwick.ac.uk/fac/sci/physics/research/condensedmatt/ferroelectrics/xtop2010/
Contributed Abstract Deadline:30/04/10

X-Ray Scattering Methods for Characterization of Advanced Materials Workshop, December 4, 2009, Boston, MA, USA
http://www.mrs.org/s_mrs/sec.asp?CID=24341&DID=250573

DRIP XIII Conference, September 13-17, 2009 Wheeling, West Virginia, USA
13th International Conference on Defects, Recognition, Imaging and Physics in Semiconductors (DRIP XIII)
http://www.tms.org/Meetings/Specialty/drip09/home.html　
memo:メンバーからは志村（阪大）、山口さん（産総研）が参加。X-ray topographyのセッションもあり、それ以外でもSiやワイドバンドギャップ半導体関連のセッションでX-ray topographyを使った発表が数件ありました。by 志村（阪大）

2009 Denver X-ray Conference, 27-31 July 2009 Crown Plaza, Colorado Springs, Colorado U.S.A
http://www.dxcicdd.com/

2008/12/16 2009年6月の春にStrasbourgでE-MRSの中で行われるX線関連のシンポジウム "X-ray Techniques for Advanced Materials, Nanostructures and Thin Films: from Laboratory Sources to Synchrotron Radiation"

XTOP 2008, 15-19 September 2008, Linz (Austria)
9th Biennial Conference on High Resolution X-Ray Diffraction and Imaging
http://www.hlphys.jku.at/xtop2008/xtop2008.html