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関連する国際会議 †

• DRIP XIX, The 19th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors (DRIP19) will be held ONLINE, Aug. 29-Sep. 1 (Japan time), 2022.
  https://confit.atlas.jp/guide/event/drip19/top
  Deadline for submission of abstracts is June 30, 2022.

• XTOP 2020, 15th Biennial Conference on High Resolution X-Ray Diffraction and Imaging will be held in Minsk, Belarus from 13th to 18th of September, 2020.
  https://xtop2020.atomicus.by/
  Deadline for submission of abstracts is 15th April 2020.

• XTOP 2016, The 13th Biennial Conference on High Resolution X-Ray Diffraction and Imaging, September 4 - 8, 2016 in Brno, Czech Republic
  http://xtop2016.sci.muni.cz/
  Deadline for submission of abstracts is May 25, 2016.

• AsCA 12/CRYSTAL 28, A Joint Meeting of the Asian Crystallographic Association (AsCA), Society of Crystallographers in Australia and New Zealand (SCANZ) and the BRAGG Symposium, 2-6 December, 2012 in Adelaide, Australia　
  http://www.sapmea.asn.au/conventions/crystal2012/index.html　
  Abstract Submission Deadline: now extended until 31st August 2012

• XTOP 2012, The 11th Biennial Conference on High Resolution X-Ray Diffraction and Imaging, September 15 - 20, 2012 in St. Petersburg, Russia
  http://www.xtop12.org/
  Deadline for submission of abstracts is April 1, 2012.

• Denver X-ray Conference, 6-10 August 2012, Denver Marriot Tech Center Hotel, Denver, Colorado, USA
  http://www.dxcicdd.com/
  Deadline for submission of abstracts is 1 March, 2012.

• International Conference on Electronic Materials (ICEM) sponsored by the International Union of Materials Research Societies (IUMRS-ICEM 2012), 23rd (Sun.) to 28th (Fri.) September at Pacifico Yokohama, Yokohama, Japan.
  http://iumrs-icem2012.org/index.html
  Symposium D-7: Innovative Imaging Technologies and Applications from Nanometrologies to Bioinstrumentations
  http://iumrs-icem2012.org/symposia/d/07.html
  Deadline of the abstract submission is 31st March 2012.

• Denver X-ray Conference, 1-5 August 2011, Colorado Springs, Colorado, USA
  http://www.dxcicdd.com/11/index.htm
  Deadline for submission of abstracts is 15 Feb. 2011.

• DRIP XIV, 14th International Conference on Defects - Recognition, imaging and　Physics in Semiconductors, September 25-29，2011, MIYAZAKI, JAPAN
  http://www.miyazaki-u.ac.jp/~drip14/index.html
  Abstract Submission Deadline: April 25, 2011

• XTOP 1010, 20th-23rd September 2010, University of Warwick (UK)
  10th Biennial Conference on High Resolution X-Ray Diffraction and Imaging
  http://www2.warwick.ac.uk/fac/sci/physics/research/condensedmatt/ferroelectrics/xtop2010/
  Contributed Abstract Deadline:30/04/10

• X-Ray Scattering Methods for Characterization of Advanced Materials Workshop, December 4, 2009, Boston, MA, USA
  http://www.mrs.org/s_mrs/sec.asp?CID=24341&DID=250573

• DRIP XIII Conference, September 13-17, 2009 Wheeling, West Virginia, USA
  13th International Conference on Defects, Recognition, Imaging and Physics in Semiconductors (DRIP XIII)
  http://www.tms.org/Meetings/Specialty/drip09/home.html　
  memo:メンバーからは志村（阪大）、山口さん（産総研）が参加。X-ray topographyのセッションもあり、それ以外でもSiやワイドバンドギャップ半導体関連のセッションでX-ray topographyを使った発表が数件ありました。by 志村（阪大）

• 2009 Denver X-ray Conference, 27-31 July 2009 Crown Plaza, Colorado Springs, Colorado U.S.A
  http://www.dxcicdd.com/

• 2008/12/16 2009年6月の春にStrasbourgでE-MRSの中で行われるX線関連のシンポジウム "X-ray Techniques for Advanced Materials, Nanostructures and Thin Films: from Laboratory Sources to Synchrotron Radiation"

• XTOP 2008, 15-19 September 2008, Linz (Austria)
  9th Biennial Conference on High Resolution X-Ray Diffraction and Imaging
  http://www.hlphys.jku.at/xtop2008/xtop2008.html