Meetings のバックアップ(No.11) - X線トポグラフィ研究会ホームページ

関連する国際会議 †

XTOP 2016, The 13th Biennial Conference on High Resolution X-Ray Diffraction and Imaging, September 4 - 8, 2016 in Brno, Czech Republic
http://xtop2016.sci.muni.cz/
Deadline for submission of abstracts is May 25, 2016.

AsCA 12/CRYSTAL 28, A Joint Meeting of the Asian Crystallographic Association (AsCA), Society of Crystallographers in Australia and New Zealand (SCANZ) and the BRAGG Symposium, 2-6 December, 2012 in Adelaide, Australia　
http://www.sapmea.asn.au/conventions/crystal2012/index.html　
Abstract Submission Deadline: now extended until 31st August 2012

XTOP 2012, The 11th Biennial Conference on High Resolution X-Ray Diffraction and Imaging, September 15 - 20, 2012 in St. Petersburg, Russia
http://www.xtop12.org/
Deadline for submission of abstracts is April 1, 2012.

Denver X-ray Conference, 6-10 August 2012, Denver Marriot Tech Center Hotel, Denver, Colorado, USA
http://www.dxcicdd.com/
Deadline for submission of abstracts is 1 March, 2012.

International Conference on Electronic Materials (ICEM) sponsored by the International Union of Materials Research Societies (IUMRS-ICEM 2012), 23rd (Sun.) to 28th (Fri.) September at Pacifico Yokohama, Yokohama, Japan.
http://iumrs-icem2012.org/index.html
Symposium D-7: Innovative Imaging Technologies and Applications from Nanometrologies to Bioinstrumentations
http://iumrs-icem2012.org/symposia/d/07.html
Deadline of the abstract submission is 31st March 2012.

Denver X-ray Conference, 1-5 August 2011, Colorado Springs, Colorado, USA
http://www.dxcicdd.com/11/index.htm
Deadline for submission of abstracts is 15 Feb. 2011.

DRIP XIV, 14th International Conference on Defects - Recognition, imaging and　Physics in Semiconductors, September 25-29，2011, MIYAZAKI, JAPAN
http://www.miyazaki-u.ac.jp/~drip14/index.html
Abstract Submission Deadline: April 25, 2011

XTOP 1010, 20th-23rd September 2010, University of Warwick (UK)
10th Biennial Conference on High Resolution X-Ray Diffraction and Imaging
http://www2.warwick.ac.uk/fac/sci/physics/research/condensedmatt/ferroelectrics/xtop2010/
Contributed Abstract Deadline:30/04/10

X-Ray Scattering Methods for Characterization of Advanced Materials Workshop, December 4, 2009, Boston, MA, USA
http://www.mrs.org/s_mrs/sec.asp?CID=24341&DID=250573

DRIP XIII Conference, September 13-17, 2009 Wheeling, West Virginia, USA
13th International Conference on Defects, Recognition, Imaging and Physics in Semiconductors (DRIP XIII)
http://www.tms.org/Meetings/Specialty/drip09/home.html　
memo:メンバーからは志村（阪大）、山口さん（産総研）が参加。X-ray topographyのセッションもあり、それ以外でもSiやワイドバンドギャップ半導体関連のセッションでX-ray topographyを使った発表が数件ありました。by 志村（阪大）

2009 Denver X-ray Conference, 27-31 July 2009 Crown Plaza, Colorado Springs, Colorado U.S.A
http://www.dxcicdd.com/

XTOP 2008, 15-19 September 2008, Linz (Austria)
9th Biennial Conference on High Resolution X-Ray Diffraction and Imaging
http://www.hlphys.jku.at/xtop2008/xtop2008.html