![[FrontPage]](image/iida_3-fig.png "[FrontPage]")
#norelated * 関連する国際会議 [#md2edfe6] - ''DRIP XIV'', 14th International Conference on Defects - Recognition, imaging and Physics in Semiconductors, September 25-29，2011, MIYAZAKI, JAPAN &br; http://www.miyazaki-u.ac.jp/~drip14/index.html &br; Abstract Submission Deadline: April 25, 2011 - ''XTOP 1010'', 20th-23rd September 2010, University of Warwick (UK) &br; 10th Biennial Conference on High Resolution X-Ray Diffraction and Imaging &br; http://www2.warwick.ac.uk/fac/sci/physics/research/condensedmatt/ferroelectrics/xtop2010/ &br; Contributed Abstract Deadline:30/04/10 - ''X-Ray Scattering Methods for Characterization of Advanced Materials Workshop'', December 4, 2009, Boston, MA, USA &br; http://www.mrs.org/s_mrs/sec.asp?CID=24341&DID=250573 - ''DRIP XIII Conference'', September 13-17, 2009 Wheeling, West Virginia, USA &br; 13th International Conference on Defects, Recognition, Imaging and Physics in Semiconductors (DRIP XIII) &br; http://www.tms.org/Meetings/Specialty/drip09/home.html &br; memo:メンバーからは志村（阪大）、山口さん（産総研）が参加。X-ray topographyのセッションもあり、それ以外でもSiやワイドバンドギャップ半導体関連のセッションでX-ray topographyを使った発表が数件ありました。by 志村（阪大） - ''2009 Denver X-ray Conference'', 27-31 July 2009 Crown Plaza, Colorado Springs, Colorado U.S.A &br; http://www.dxcicdd.com/ - 2008/12/16 2009年6月の春にStrasbourgで''E-MRS''の中で行われるX線関連のシンポジウム [["X-ray Techniques for Advanced Materials, Nanostructures and Thin Films: from Laboratory Sources to Synchrotron Radiation">E MRS X ray symposium 2009]] - ''XTOP 2008'', 15-19 September 2008, Linz (Austria) &br; 9th Biennial Conference on High Resolution X-Ray Diffraction and Imaging &br; http://www.hlphys.jku.at/xtop2008/xtop2008.html
