- 追加された行はこの色です。
- 削除された行はこの色です。
#norelated
* 関連する国際会議 [#md2edfe6]
- ''X-Ray Scattering Methods for Characterization of Advanced Materials Workshop'', December 4, 2009, Boston, MA, USA &br;
http://www.mrs.org/s_mrs/sec.asp?CID=24341&DID=250573
- ''DRIP XIII Conference'', September 13-17, 2009 Wheeling, West Virginia, USA &br;
13th International Conference on Defects, Recognition, Imaging and Physics in Semiconductors (DRIP XIII) &br; http://www.tms.org/Meetings/Specialty/drip09/home.html
13th International Conference on Defects, Recognition, Imaging and Physics in Semiconductors (DRIP XIII) &br; http://www.tms.org/Meetings/Specialty/drip09/home.html &br;
memo:メンバーからは志村(阪大)、山口さん(産総研)が参加。X-ray topographyのセッションもあり、それ以外でもSiやワイドバンドギャップ半導体関連のセッションでX-ray topographyを使った発表が数件ありました。by 志村(阪大)
- ''2009 Denver X-ray Conference'', 27-31 July 2009 Crown Plaza, Colorado Springs, Colorado U.S.A &br;
http://www.dxcicdd.com/
- 2008/12/16 2009年6月の春にStrasbourgで''E-MRS''の中で行われるX線関連のシンポジウム
[["X-ray Techniques for Advanced Materials, Nanostructures and Thin Films: from Laboratory Sources to Synchrotron Radiation">E MRS X ray symposium 2009]]
- ''XTOP 2008'', 15-19 September 2008, Linz (Austria) &br;
9th Biennial Conference on High Resolution X-Ray Diffraction and Imaging &br;
http://www.hlphys.jku.at/xtop2008/xtop2008.html