Diff of Meetings - Homepage of X-ray Topography Group

The added line is THIS COLOR.
The deleted line is THIS COLOR.
Go to Meetings.
Deleting diff of Meetings
#norelated

* Related International Meetings, Conferences, Symposiums [#md2edfe6]
* Related International Meetings, Conferences, Symposia [#md2edfe6]

- ''XTOP 2012'', September 15 - 20, 2012 in St. Petersburg, Russia &br; 
http://www.xtop12.org/ &br;
Deadline for submission of abstracts is April 1, 2012. 

- ''International Conference on Electronic Materials (ICEM) sponsored by the International Union of Materials Research Societies (IUMRS-ICEM 2012)'', 23rd (Sun.) to 28th (Fri.) September at Pacifico Yokohama, Yokohama, Japan. &br;
http://iumrs-icem2012.org/index.html &br;
Symposium D-7: 
''Innovative Imaging Technologies and Applications from Nanometrologies to Bioinstrumentations'' &br;
http://iumrs-icem2012.org/symposia/d/07.html &br;
Deadline of the abstract submission is 31st March 2012.



- ''Denver X-ray Conference'', 1-5 August 2011, Colorado Springs, Colorado, USA &br; 
http://www.dxcicdd.com/11/index.htm &br;
Deadline for submission of abstracts is 15 Feb. 2011.

- ''DRIP XIV'', 14th International Conference on Defects - Recognition, imaging and　Physics in Semiconductors, September 25-29，2011, MIYAZAKI, JAPAN  &br;
http://www.miyazaki-u.ac.jp/~drip14/index.html &br;
Abstract Submission Deadline: April 25, 2011 

- ''XTOP 1010'', 20th-23rd September 2010, University of Warwick (UK) &br;
10th Biennial Conference on High Resolution X-Ray Diffraction and Imaging &br;
http://www2.warwick.ac.uk/fac/sci/physics/research/condensedmatt/ferroelectrics/xtop2010/ &br;
Contributed Abstract Deadline:30/04/10

- ''X-Ray Scattering Methods for Characterization of Advanced Materials Workshop'', December 4, 2009, Boston, MA, USA &br;
http://www.mrs.org/s_mrs/sec.asp?CID=24341&DID=250573

- ''DRIP XIII Conference'', September 13-17, 2009 Wheeling, West Virginia, USA &br;
13th International Conference on Defects, Recognition, Imaging and Physics in Semiconductors (DRIP XIII) &br;  http://www.tms.org/Meetings/Specialty/drip09/home.html　&br; 
memo:メンバーからは志村（阪大）、山口さん（産総研）が参加。X-ray topographyのセッションもあり、それ以外でもSiやワイドバンドギャップ半導体関連のセッションでX-ray topographyを使った発表が数件ありました。by 志村（阪大）

- ''2009 Denver X-ray Conference'', 27-31 July 2009 Crown Plaza, Colorado Springs, Colorado U.S.A &br;
http://www.dxcicdd.com/

- 2008/12/16 2009年6月の春にStrasbourgで''E-MRS''の中で行われるX線関連のシンポジウム
[["X-ray Techniques for Advanced Materials, Nanostructures and Thin Films: from Laboratory Sources to Synchrotron Radiation">E MRS X ray symposium 2009]]

- ''XTOP 2008'', 15-19 September 2008, Linz (Austria) &br;
9th Biennial Conference on High Resolution X-Ray Diffraction and Imaging &br;
http://www.hlphys.jku.at/xtop2008/xtop2008.html