Related International Meetings, Conferences, Symposia

  • XTOP 2012, September 15 - 20, 2012 in St. Petersburg, Russia
    http://www.xtop12.org/
    Deadline for submission of abstracts is April 1, 2012.
  • International Conference on Electronic Materials (ICEM) sponsored by the International Union of Materials Research Societies (IUMRS-ICEM 2012), 23rd (Sun.) to 28th (Fri.) September at Pacifico Yokohama, Yokohama, Japan.
    http://iumrs-icem2012.org/index.html
    Symposium D-7: Innovative Imaging Technologies and Applications from Nanometrologies to Bioinstrumentations
    http://iumrs-icem2012.org/symposia/d/07.html
    Deadline of the abstract submission is 31st March 2012.
  • DRIP XIV, 14th International Conference on Defects - Recognition, imaging and Physics in Semiconductors, September 25-29,2011, MIYAZAKI, JAPAN
    http://www.miyazaki-u.ac.jp/~drip14/index.html
    Abstract Submission Deadline: April 25, 2011
  • DRIP XIII Conference, September 13-17, 2009 Wheeling, West Virginia, USA
    13th International Conference on Defects, Recognition, Imaging and Physics in Semiconductors (DRIP XIII)
    http://www.tms.org/Meetings/Specialty/drip09/home.html 
    memo:メンバーからは志村(阪大)、山口さん(産総研)が参加。X-ray topographyのセッションもあり、それ以外でもSiやワイドバンドギャップ半導体関連のセッションでX-ray topographyを使った発表が数件ありました。by 志村(阪大)
  • 2009 Denver X-ray Conference, 27-31 July 2009 Crown Plaza, Colorado Springs, Colorado U.S.A
    http://www.dxcicdd.com/

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Last-modified: 2019-06-13 (Thu) 04:35:38 (1771d)