Diff of Purpose - Homepage of X-ray Topography Group

The added line is THIS COLOR.
The deleted line is THIS COLOR.
Go to Purpose.
Deleting diff of Purpose
#author("2019-06-13T14:37:31+09:00","default:xtopo","xtopo")
#author("2019-06-13T14:39:47+09:00","default:xtopo","xtopo")
*Purpose [#o5fe52b9]



X-ray topography is a nondestructive characterization technique of defects in crystals by means of X-ray diffraction and scattering, providing us with the distribution of defects in real space. The aim of the group is the further development and improvement of X-ray topography and its application to the field of materials science and engineering. 

In the development of the advanced techniques in X-ray topography we utilize high flux, brilliance, energy, and coherence in synchrotron X-rays of SPring-8, and aim for high spatial and time resolution, and improvement of image quality. We, then, expand the range of the application to what were difficult to observe and characterize.  

By using these advanced techniques we characterize the defects in a variety of inorganic and organic materials, artificial crystals, multilayer structures, and artificial nonuniform structures. We also apply to the nondestructive characterization of lattice defects and strain inside electric devices and contribute to the optimization and the improvement of the device performance by the interrelationships with industrial researchers. 

We hold several meetings in a year in order to exchange of information related with the techniques and materials and foster of new idea of X-ray topography.